Vertical type high frequency probe card

Details Vertical type high frequency probe card Vertical type high frequency probe card

2008-05-06

2008-05-06

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S755090, C324S758010, C324S761010

Reexamination Certificate

active

07368928

ABSTRACT:
A vertical-type probe card includes a circuit board, which has signal circuits and grounding circuits arranged in such a manner that each signal circuit is disposed in parallel and adjacent to one grounding circuit and kept a predetermined distance from the grounding circuit, and a probe assembly, which is arranged at the bottom side of the circuit board and has an upper guide plate, a lower guide plate, a conducting layer provided on the lower guide plate, a plurality of signal probes respectively electrically connected to the signal circuits and adjacent to a plurality of compensation probes, and at least one grounding probe electrically connected to the grounding circuits in a manner that the signal, compensation and grounding probes are vertically inserted through the upper and lower guide plates, and the conducting layer is conducted with the compensation probe and the grounding probe while electrically insulated to the signal probe.

REFERENCES:
patent: 5461327 (1995-10-01), Shibata et al.
patent: 5525911 (1996-06-01), Marumo et al.
patent: 6292003 (2001-09-01), Fredrickson et al.
patent: 6861858 (2005-03-01), Chen et al.
patent: 2002/0041189 (2002-04-01), Okubo et al.
patent: 0 180 013 (1986-05-01), None

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