X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2006-07-18
2006-07-18
Glick, Edward J. (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
C378S079000
Reexamination Certificate
active
07079621
ABSTRACT:
The present invention relates to a method for performing a transmission diffraction analysis of an analyte on a support surface, wherein the method comprises: irradiating said analyte with a radiation beam generated by a source of radiation, and detecting said radiation after passing through the analyte. The method is characterised in that irradiation is performed such that the radiation beam strikes the analyte in a substantially vertical and substantially perpendicular direction. Further the present invention relates to an apparatus for performing a transmission diffraction analysis.
REFERENCES:
patent: 3354308 (1967-11-01), Engel et al.
patent: 3378684 (1968-04-01), Mentink et al.
patent: 4821303 (1989-04-01), Fawcett et al.
patent: 5629524 (1997-05-01), Stettner et al.
patent: 6122344 (2000-09-01), Beevor
patent: 6371640 (2002-04-01), Hajduk et al.
patent: 6507636 (2003-01-01), Lehmann
patent: 6859520 (2005-02-01), He et al.
patent: 2004/0223586 (2004-11-01), He et al.
patent: WO 00/36405 (2000-06-01), None
patent: WO 02/057763 (2002-07-01), None
Chayen, et al. An Automated System for MicroBatch Protein Crystallization and Screening 10565 Journal of Applied Crystallography 23(1990) Copenhagen, DK.
JP 2000212137 (Abstract) Feb. 8, 2000.
Blomsma Erwin
van Langevelde Adriaan Jan
Avantium International B.V.
Glick Edward J.
Hoffmann & Baron , LLP
Yun Jurie
LandOfFree
Vertical transmission diffraction analysis does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Vertical transmission diffraction analysis, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Vertical transmission diffraction analysis will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3540034