Geometrical instruments – Gauge – Coordinate movable probe or machine
Patent
1996-08-21
1999-03-16
Fulton, Christopher W.
Geometrical instruments
Gauge
Coordinate movable probe or machine
33 1M, G01B 5004
Patent
active
058814701
ABSTRACT:
A two-axis measurement system includes a structural support frame having at least two horizontally disposed parallel rails defining a length of the structural support frame at opposite sides thereof. The support frame further defines a test space between the opposite sides. A bridge extends perpendicularly between the rails and is capable of controlled movement along the rails over the length of the structural support frame. A first probe carriage carried by the bridge permits controlled movement along a span of the bridge. A vertical tower is coupled to the bridge orthogonally with the rails, and a second probe carriage is carried by the vertical tower permitting controlled movement along a height of the vertical tower. The first probe carriage is selectively moveable within a horizontal test plane defined in a first axial dimension by the rails and in a second axial dimension by the bridge by cooperative movement of the bridge and the first probe carriage. The second probe carriage is selectively moveable within a vertical test plane defined in the first axial dimension by the rails and in a third axial dimension by the vertical tower by cooperative movement of the bridge and the second probe carriage.
REFERENCES:
patent: 4833789 (1989-05-01), Zona
patent: 4953306 (1990-09-01), Weckenmann et al.
patent: 5152070 (1992-10-01), Sorokes
patent: 5285397 (1994-02-01), Heier et al.
patent: 5408318 (1995-04-01), Slater
Hindman Gregory E.
Paige Thomas
Slater Dan
Fulton Christopher W.
Nearfield Systems Incorporated
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