Vertical probe device

Details Vertical probe device Vertical probe device

2008-07-15

2008-07-15

Nguyen, Ha (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S758010, C324S761010

Reexamination Certificate

active

07400156

ABSTRACT:
A vertical probe device includes two guide members arranged in a stack manner and defining therebetween an accommodation chamber, a probe holder plate disposed between the guide members, and a plurality of probes inserted through the guide plates and the probe holder plate in such a manner that the probes are flexible within the accommodation chamber. One of the guide plates has at least one through hole. The probe holder plate is slightly moveable in horizontal and vertical directions but fixable to one of the guide plats under a force applied through the at least one through hole to the probe holder plate while the other of the guide plates is removed, thereby preventing damage of the probes or movement of the probes during a maintenance work.

REFERENCES:
patent: 4901013 (1990-02-01), Benedetto et al.
patent: 5525911 (1996-06-01), Marumo et al.
patent: 6853208 (2005-02-01), Okubo et al.
patent: 2004/0124862 (2004-07-01), Sugawara
patent: 2006/0066328 (2006-03-01), Clegg et al.
patent: 2007/0103179 (2007-05-01), Tsai et al.

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