Vertical probe and methods of fabricating and bonding the same

Details Vertical probe and methods of fabricating and bonding the same Vertical probe and methods of fabricating and bonding the same

2006-07-19

2010-11-09

Hollington, Jermele M (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07830162

ABSTRACT:
Disclosed is a vertical probe and methods of fabricating and bonding the same. The probe is comprised of a contactor equipped with two tips, a connector electrically linking with a measuring terminal of a measurement system, And a bump connecting the contactor to the connector and buffing physical stress to the contactor.

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English language abstract of Korean Patent Publication No. KR 1020040000111, Jan. 3, 2004.
English language abstract of Korean Patent Publication No. KR 100446551, Aug. 23, 2004.

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