Vertical indent production repair

Semiconductor device manufacturing: process – Making device or circuit emissive of nonelectrical signal – Substrate dicing

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S068000, C438S113000, C438S458000, C438S460000, C438S462000, C257SE21214

Reexamination Certificate

active

07829360

ABSTRACT:
A method of nanomachining is provided. The method includes plunging a nanometer-scaled tip into a surface of a substrate at a first location in a first direction that is substantially perpendicular to the surface, thereby displacing a first portion of the substrate with the tip. The method also includes withdrawing the tip from the substrate in a second direction that is substantially opposite to the first direction. The method further includes moving at least one of the tip and the substrate laterally relative to each other. In addition, the method also includes plunging the tip into the substrate at a second location in a third direction that is substantially parallel to the first direction, thereby displacing a second portion of the substrate with the tip and withdrawing the tip from the substrate in a fourth direction that is substantially opposite to the third direction.

REFERENCES:
patent: 2005/0250296 (2005-11-01), Yamamura et al.
patent: 2006/0166465 (2006-07-01), Ono
patent: 2008/0070380 (2008-03-01), Kusunoki

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Vertical indent production repair does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Vertical indent production repair, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Vertical indent production repair will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4245464

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.