X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2011-08-16
2011-08-16
Ho, Allen C. (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
C378S071000, C378S079000, C378S081000, C378S086000
Reexamination Certificate
active
08000444
ABSTRACT:
A vertical/horizontal small angle X-ray scattering apparatus, for enabling plural numbers of X-ray diffraction measurements, such as, transmission small angle X-ray diffraction, reflection small angle scattered X-ray diffraction, and in-plane X-ray diffraction, etc., comprises an X-ray generating apparatus11for generating X-ray, an optic system16for forming the X-ray into a predetermined incident beam of X-ray, a sample holder portion120for mounting a sample to be measured thereon, to irradiate the incident beam of X-ray thereupon, a vacuum path17for passing through small angle scattered X-ray from the sample, and an X-ray detector18for detecting the small angle scattered X-ray passing through the vacuum path, wherein the sample holder portion is fixed on a support base110, while attaching the X-ray generating apparatus, the optic system, the vacuum path and the X-ray detector on a bench100, as well, to be rotatable around the sample holder portion, and thereby enabling plural numbers of measurements of small angle X-ray scattering.
REFERENCES:
patent: 6041098 (2000-03-01), Touryanski et al.
patent: 6226349 (2001-05-01), Schuster et al.
patent: 6330301 (2001-12-01), Jiang
patent: 6718008 (2004-04-01), He et al.
patent: 6731719 (2004-05-01), Fewster et al.
patent: 6895075 (2005-05-01), Yokhin et al.
patent: 6937695 (2005-08-01), Hoshino
patent: 6956928 (2005-10-01), He et al.
patent: 6993113 (2006-01-01), Hoshino et al.
patent: 7145983 (2006-12-01), Taguchi et al.
patent: 7258485 (2007-08-01), Nakano et al.
patent: 7269245 (2007-09-01), He et al.
patent: 7443952 (2008-10-01), Dosho et al.
patent: 7471766 (2008-12-01), Dosho
patent: 7646849 (2010-01-01), Iwasaki et al.
patent: 2004/0223586 (2004-11-01), He et al.
patent: 02-085747 (1990-03-01), None
patent: 07-140096 (1995-06-01), None
patent: 07-311163 (1995-11-01), None
patent: 10-300693 (1998-11-01), None
patent: 2000-146870 (2000-05-01), None
patent: 2000-266696 (2000-09-01), None
patent: 2000-325336 (2000-11-01), None
patent: 2002-505903 (2002-02-01), None
patent: 2004-020397 (2004-01-01), None
patent: 2004-177248 (2004-06-01), None
“Characterization of Polymer Thin Films With Small-Angle X-ray Scattering under Grazing Incidence (GISAXS)”, Smilgies et al, Synchrotron Radiation News, vol. 15, No. 5, 2002 pp. 35-42.
Japanese Office Action, dated Aug. 2, 2010, issued in corresponding Japanese Patent Application No. 2007-533127.
Antonelli, Terry Stout & Kraus, LLP.
Ho Allen C.
Rigaku Corporation
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