Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate
2007-05-08
2007-05-08
Lee, Hwa (Andrew) (Department: 2877)
Optics: measuring and testing
By light interference
For dimensional measurement
C356S479000
Reexamination Certificate
active
11065017
ABSTRACT:
A MEMS vertical displacement device capable of moving one or more vertically displaceable platforms relative to a base. In particular, the vertical displacement device may be capable of moving a vertically displaceable platform so that the vertically displaceable platform remains generally parallel to a base. The vertically displaceable platform may be, but is not limited to, a microlens, a micromirror, micro-grating, or other device. The vertical displacement device may also be included in optical coherence and confocal imaging systems.
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Akerman & Senterfitt
Dixon Michael K.
Lee Hwa (Andrew)
University of Florida Research Foundation Inc.
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