Data processing: measuring – calibrating – or testing – Measurement system – Statistical measurement
Reexamination Certificate
2005-09-06
2005-09-06
Nghiem, Michael (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Statistical measurement
Reexamination Certificate
active
06941242
ABSTRACT:
The present invention defines a versatile system for analyzing accuracy of industrial measurement data. The system of the present invention compiles measurements of a primary device characteristic from a representative cross-section of a population of devices. The system provides a modeling function, from which is determined a variance for each measurement—forming a corresponding compilation of variances (200). The compilation of variances is evaluated for discontinuities (300), to identify a discontinuity within the compilation of variances. This discontinuity is utilized to determine a demarcation (302) between accurate and inaccurate measurement data.
REFERENCES:
patent: 2005/0064608 (2005-03-01), Patel et al.
Patel Nital S.
Tiwari Rajesh
Brady III W. James
McLarty Peter K.
Nghiem Michael
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
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