Versatile system for high resolution device calibration

Details Versatile system for high resolution device calibration Versatile system for high resolution device calibration

2005-02-15

2005-02-15

Nguyen, Linh My (Department: 2816)

Miscellaneous active electrical nonlinear devices, circuits, and

Signal converting, shaping, or generating

C327S141000

Reexamination Certificate

active

06856174

ABSTRACT:
The present invention provides a system for providing high-resolution calibration of a programmable semiconductor component (518). The system calibrates the programmable semiconductor component, within a desired accuracy, to a goal value (802). The system provides a primary DAC function (510) and a supplemental DAC function (512), as well as a control function (506). The control function is utilized to determine a first bit step (806) of the primary DAC function that corresponds to the goal value. The control function then determines a second bit step (810) of the supplemental DAC function that corresponds to the goal value. The bit codes of the first and second bit steps are combined by a summing function (514), to provide a programming control word for the programmable semiconductor component.

REFERENCES:
patent: 6118988 (2000-09-01), Choi
patent: 6597300 (2003-07-01), Mori

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