Versatile semiconductor test structure array

Details Versatile semiconductor test structure array Versatile semiconductor test structure array

2008-07-29

2008-07-29

Nguyen, Ha (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010

Reexamination Certificate

active

07405585

ABSTRACT:
This invention discloses a semiconductor test structure array comprising a plurality of unit cells for containing devices under test (DUT) arranged in an addressable array, and an access-control circuitry within each unit cell for controlling accesses to one or more DUTs, wherein the access-control circuitry comprises at least four identical controlled transmission gates (CTGs), and a plurality of the access-control circuitries are isomorphic.

REFERENCES:
patent: 4961053 (1990-10-01), Krug
patent: 5070297 (1991-12-01), Kwon et al.
patent: 5241266 (1993-08-01), Ahmad et al.
patent: 5389556 (1995-02-01), Rostoker et al.
patent: 5446395 (1995-08-01), Goto
patent: 5608335 (1997-03-01), Tailliet
patent: 5648661 (1997-07-01), Rostoker et al.
patent: 5654588 (1997-08-01), Dasse et al.
patent: 5764654 (1998-06-01), Ohba et al.
patent: 5838163 (1998-11-01), Rostoker et al.
patent: 5841961 (1998-11-01), Kozaru et al.
patent: 6286116 (2001-09-01), Bhavsar
patent: 6323664 (2001-11-01), Kim et al.
patent: 6539324 (2003-03-01), Miyatake et al.
patent: 6781899 (2004-08-01), Han et al.
patent: 6867580 (2005-03-01), de Jong et al.
patent: 7071487 (2006-07-01), Maruyama
patent: 2003/0126525 (2003-07-01), Miyashita et al.
patent: 2006/0048031 (2006-03-01), Aadsen et al.
Doong, Kelvin Y.Y., et al., “Field-Configurable Test Structure Array (FC-TSA): Enabling design for monitor, model and manufacturability”, IEEE Int'l Conference on Microelectronic Test Structures, Mar. 6-9, 2006.

Affiliated with

Also associated with

Rating

Versatile semiconductor test structure array does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Versatile semiconductor test structure array, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Versatile semiconductor test structure array will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2761952