Versatile focusing radiation analyzer

X-ray or gamma ray systems or devices – Specific application – Mossbauer effect

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Details

378 83, 378 84, 378 85, G01N 2302, G01N 2320, G01N 2322

Patent

active

044465688

ABSTRACT:
A versatile focusing radiation analyzer for EXAFS, fluorescence EXAFS, Raman or modified Compton scattering, diffraction, Rayleigh scattering and other experiments is comprised of a concave focusing element (10) placed at the end of a central arm (11) pivoted at the center (24) of a circle (21). Side arms (12, 13) are also pivoted at the center (24). A platform (17) supports an X-ray source (50, 61, 66) or a sample (16) at the end of one side arm (12) while a platform (23) supports a detector (22, 63, 66), sample (51) and detector (52) or Mossbauer source (80). Constraining bars (14, 15) attached to the side arms and to a slide (29) in a slot (30) cause one side arm (13) to maintain an angle (.theta.) with the center arm equal to the angle of the other side arm (12) with the center arm as the center arm is driven relative to that side arm by suitable means (25-28). Rods (31, 32) or belts (36, 38) with pulleys (35, 37) maintain the optical axis of the elements on the platforms (17, 23) directed to the center of the focusing element (10) as the angle (.theta.) is varied. The focusing element (10) may be a single crystal bent and polished to a Johanssen focusing configuration, or a sample bent to the same configuration, depending on the experiment. A small focusing crystal (20) may be used to select one of the characteristic lines of the X-ray source (19). The acquisition time of a complete scan of the angle .theta. may be reduced without increasing the source intensity or sacrificing resolution due to the focusing geometry of the concave element.

REFERENCES:
patent: 2898469 (1959-08-01), Rose
patent: 2951157 (1970-08-01), Haine et al.
patent: 3073952 (1963-01-01), Rose
patent: 4078175 (1978-03-01), Fletcher et al.

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