Vernier index position sensor

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer

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Details

25023117, G01B 902

Patent

active

058568727

ABSTRACT:
An index structure and method are disclosed which employ, in addition to a main diffractive grating track of an encoder, a short diffractive grating track (the vernier or index track) having a different frequency than that of the main track. The phase of the index track is used to provide windows for the main track in a manner so that a preselected phase condition of the main track occurs in only one of the windows provided by the index track.

REFERENCES:
patent: 4266125 (1981-05-01), Epstein et al.
patent: 5486923 (1996-01-01), Mitchell et al.

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