Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1997-10-02
1999-01-05
Turner, Samuel A.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
25023117, G01B 902
Patent
active
058568727
ABSTRACT:
An index structure and method are disclosed which employ, in addition to a main diffractive grating track of an encoder, a short diffractive grating track (the vernier or index track) having a different frequency than that of the main track. The phase of the index track is used to provide windows for the main track in a manner so that a preselected phase condition of the main track occurs in only one of the windows provided by the index track.
REFERENCES:
patent: 4266125 (1981-05-01), Epstein et al.
patent: 5486923 (1996-01-01), Mitchell et al.
MicroE, Inc.
Turner Samuel A.
LandOfFree
Vernier index position sensor does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Vernier index position sensor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Vernier index position sensor will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-866414