Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing
Reexamination Certificate
2011-06-28
2011-06-28
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Integrated circuit design processing
Reexamination Certificate
active
07971162
ABSTRACT:
A method to assess spare latch placement in a macro, the method comprises steps of: determining a location for each spare latch in the macro; examining local clock buffers associated with the macro to locate any local clock buffers without a spare latch directly attached to clock nets driven by said local clock buffer; measuring a distance between each of the local clock buffers without spare latches and a closest spare latch; running statistics for the local clock buffers from the measuring step; and locating macros with inadequate spare latch placement using the statistics.
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Chiang Jack
International Business Machines - Corporation
Kinnaman, Jr. William A.
Parihar Suchin
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