Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Calibration
Patent
1989-11-28
1991-09-10
Harvey, Jack B.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Calibration
324638, 36457101, G01R 2704
Patent
active
050477250
ABSTRACT:
A method for correcting inaccuracies in error factors of an error model used for vector-corrected, microwave-frequency measurements. Verifying de-embedded measurements are compared to known characteristics of at least one verification standard. At least one parameter of the calibration standards, or an error factor, or measuring network geometry, is changed and the error factors are recalculated to bring the verifying measurements into conformity with the known characteristics of the verification standard.
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patent: 4816767 (1989-03-01), Cannon et al.
patent: 4853613 (1989-08-01), Sequeira et al.
patent: 4858160 (1989-08-01), Strid et al.
Eul et al., "Thru-Match-Reflect: One Result of a Rigorous Theory for De-Embedding and Network Analyzer Calibration" European Microwave Conference Dec. (1988) p. 909 et seq.
Ryttling, "Appendix to an Analysis of Vector Measurement Accuracy Enhancement Techniques" Hewlett Packard (1982)/Dec.
"Model 22/42D Instruction Manual," Cascade Microtech, (1987)/Dec. pp. 4-1 through 4-42.
Davidson Andrew C.
Strid Eric W.
Cascade Microtech, Inc.
Harvey Jack B.
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