Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1989-12-01
1991-10-22
Wieder, Kenneth A.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324603, 324605, 324638, 324615, 324616, 324619, 324 77B, 328151, G01R 2316, G01R 2702
Patent
active
050599151
ABSTRACT:
A vector network analyzer comprising a circuit for measuring the real and imaginary components of the central spectral line in an RF pulse from a device-under-test is provided. The circuit comprises a modulator in response to a profiling pulse for modulating the amplitude of the RF pulse, mixers for down-converting the frequency of the amplitude modulated RF pulse, a narrow band filter for filtering the RF pulse having a bandwidth of 500 Hz and a synchronous detector responsive to the output of the crystal filter for providing a pair of dc outputs, which correspond to the real and imaginary components of the output of the device under test as the profiling pulse is shifted in time relative to the RF pulse.
REFERENCES:
patent: 3500183 (1970-03-01), McCutcheon
patent: 3621325 (1971-11-01), Moffitt
patent: 4176317 (1979-11-01), Manfreda
patent: 4758783 (1988-07-01), Danzeisen
Grace Martin I.
Kapetanic Peter M.
Solis Jose M.
Wieder Kenneth A.
Wiltron Company
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