Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Patent
1990-07-02
1992-02-18
Harvey, Jack B.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Parameter related to the reproduction or fidelity of a...
324620, 324615, 324612, G01R 2728
Patent
active
050897829
ABSTRACT:
A vector network analyzer for performing swept frequency measurements on non-linear RF devices, using either an internal or external signal source. This simplifies and speeds linear and non-linear amplifier and mixer measurements, such as impedance, amplifier gain, and mixer conversion loss, on the one hand, and measurement of harmonics, on the other hand.
REFERENCES:
patent: 3371273 (1968-02-01), Alford
patent: 3624494 (1971-11-01), Turan
patent: 3859607 (1975-01-01), Brazelton
patent: 3990004 (1976-11-01), Newton
Brown Barry A.
Pike William T.
Sharrit David D.
Harvey Jack B.
Hewlett--Packard Company
Milks, III William C.
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