VDD over and undervoltage measurement techniques using...

Details VDD over and undervoltage measurement techniques using... VDD over and undervoltage measurement techniques using...

2006-02-21

2006-02-21

Nghiem, Michael (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

Reexamination Certificate

active

07003421

ABSTRACT:
According to one embodiment, a method of testing an integrated circuit is provided. A reference voltage is coupled to each of a first and second comparator integrated on the chip. A supply voltage is compared to the reference voltage in a comparator to determine overvoltage or undervoltage conditions. The results of the comparison are stored and sizing and placing of at least one decoupling circuit in the circuit design is made based on the stored determinations.

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patent: 2004/0225333 (2004-11-01), Greatbatch et al.

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