Image analysis – Pattern recognition – Template matching
Reexamination Certificate
2006-04-11
2006-04-11
Mehta, Bhavesh M. (Department: 2627)
Image analysis
Pattern recognition
Template matching
C340S907000, C340S908100, C340S919000, C340S933000, C340S995100, C342S052000, C342S064000, C342S070000, C342S071000, C342S457000, C382S104000, C382S113000, C382S165000, C382S199000, C382S294000, C701S010000, C701S117000, C701S207000, C701S208000
Reexamination Certificate
active
07027653
ABSTRACT:
In the case where variations in ground objects in one and the same area are detected between a line drawing map describing profile lines of the ground objects or a reference line drawing/image obtained by picking up the ground objects from above, and a target image obtained by picking up the ground objects in the same area from above later on, a variation detecting apparatus collates the reference line drawing/image with the target image so as to obtain variation indexes indicating whether there are variations or not in the ground objects respectively, and displays ground objects which can be judged to have variations or ground objects which cannot be judged as to whether there are variations or not on the basis of the variation indexes, in a display mode in which an area of the reference line drawing/image including the ground objects and an area of the target image including the ground objects can be compared with each other. Accordingly, confirmation or update of variations of ground objects on a line drawing map can be coped with easily, and portions having variations can be selectively displayed so that portions where variation detection should be confirmed can be understood intuitively.
REFERENCES:
patent: 5798787 (1998-08-01), Yamaguchi et al.
patent: 5864632 (1999-01-01), Ogawa et al.
patent: 6288676 (2001-09-01), Maloney
patent: 6523024 (2003-02-01), Yajima et al.
patent: 6546118 (2003-04-01), Iisaka et al.
patent: 6590521 (2003-07-01), Saka et al.
patent: 6665439 (2003-12-01), Takahashi
patent: 6714664 (2004-03-01), Kambe et al.
patent: 6725154 (2004-04-01), Kamikawa et al.
patent: 6813370 (2004-11-01), Arai
Hino Takashi
Kodaira Takatoshi
Komura Fuminobu
Moriguchi Koichi
Crowell & Moring LLP
Desire Gregory
Hitachi Software Engineering Co. Ltd.
Mehta Bhavesh M.
LandOfFree
Variation detecting apparatus, variation detecting method,... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Variation detecting apparatus, variation detecting method,..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Variation detecting apparatus, variation detecting method,... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3563705