Variable length scan string and cell for same

Excavating

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G01R 3128

Patent

active

052572676

ABSTRACT:
A register circuit for scan path testing is provided and comprises a shifting means for shifting the data signal provided to the input means to the output means in response to a clock signal, a controllable connection means for connecting the input means and the output means, and a storage means for storing an enabling signal to enable the connection means. Preferably, the connection means will connect the input means to the output means in response to the enabling signal stored in the storage means when it is not necessary to apply data signals to the shifting means. Therefore, the data signal applied to the input means is provided to the output means without any delay in time via the connection means. As a result, the scan input of the data signal from scan path may be accomplished in a short time.

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patent: 5130647 (1992-07-01), Sakashita et al.
patent: 5150044 (1992-09-01), Hashizume et al.

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