Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Distributive type parameters
Patent
1990-11-19
1991-12-24
Wieder, Kenneth A.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Distributive type parameters
333246, 324158F, H01P 308, G01R 2704
Patent
active
050756303
ABSTRACT:
A test fixture for inverted microcircuits having spaced shelf assemblies h parallel shelves for respectively supporting a substrate for a microcircuit and a substrate for a ground plane in such a manner that the distance between them can be varied while test signals are coupled to the microcircuit via a coaxial cable coupled to a fitting on one shelf assembly and signals are coupled from the microcircuit via a coaxial cable coupled to a fitting on the other shelf assembly to test apparatus for determining the performance of the circuit.
REFERENCES:
patent: 4480240 (1984-10-01), Gould
patent: 4707656 (1987-11-01), Marzan
patent: 5017865 (1991-05-01), Oldfield
Babbitt Richard W.
Koscica Thomas E.
Rachlin Adam
Anderson William H.
Regan Maura K.
The United States of America as represented by the Secretary of
Wieder Kenneth A.
Zelenka Michael
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