Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2005-11-29
2005-11-29
Deb, Anjan (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S072500
Reexamination Certificate
active
06970001
ABSTRACT:
A variable impedance test probe of the present invention comprises a first signal conductor, a first ground reference conductor, and a first dielectric element disposed between the first signal conductor and the first ground reference conductor. The dielectric element is configured to selectively vary an impedance of the first signal conductor relative to the ground reference conductor.
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IConnect TDR Software, retrieved from [http://www.tdasystems.com] (2003), pp. 1-4.
CITS500s Controlled Impedance Test System, Polar Instruments 2000, pp. 1-6.
Barr Andrew
Chheda Sachin Navin
Dobbs Robert William
Deb Anjan
Nguyen Hoai-An D.
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