Measuring and testing – Volume or rate of flow – Weir type
Patent
1990-10-04
1994-01-04
Goldstein, Herbert
Measuring and testing
Volume or rate of flow
Weir type
G01F 152
Patent
active
052750426
ABSTRACT:
To measure flow rates, the cross-sectional shape of the flow path is changed by inserting a multiple position gate into the flow path and altering the position of the gate to maintain the head of liquid constant with a reduced flow cross section. To maintain the head at a desirable range, the depth is measured and controls the position of the gate as a feedback signal. The position of the multiple position gate is correlated with the depth to provide an indication of flow rate. For this purpose, a flow path housing is clamped to a pipe and a multiple position gate is moved by pneumatic pressure into the flow stream to change the flow cross section. The depth of the head upstream of the gate is measured and the position of the gate is measured. Flow rate is determined from these two measurements. Sampling may be performed at an increased depth caused by the gate.
REFERENCES:
patent: 1081246 (1913-12-01), McCall
patent: 1258867 (1918-03-01), Burnham
patent: 1813100 (1931-07-01), Swindle
patent: 2544948 (1951-03-01), Caldwell
patent: 2606445 (1952-08-01), Eckman
patent: 3412612 (1968-11-01), Carr
patent: 4375169 (1983-03-01), Torresin
patent: 4476707 (1984-10-01), Burns et al.
patent: 4896542 (1990-01-01), Hunter
Ideas/Applications in Engineering and Design vol. 1g No. 12 p. 241 Dec. 1975 copy.
Carson Douglas T.
Fritz Larry L.
Lederer Louis F.
Nickolaus Lowell R.
Carney Vincent L.
Goldstein Herbert
Isco, Inc.
LandOfFree
Variable gate flow analyzing method and apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Variable gate flow analyzing method and apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Variable gate flow analyzing method and apparatus will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-299257