Variable flexure test probe for microelectronic circuits

Details Variable flexure test probe for microelectronic circuits Variable flexure test probe for microelectronic circuits

1977-05-16

1979-04-24

Rolinec, Rudolph V.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

267181, 324 725, G01R 106, G01R 3102

Patent

active

041514653

ABSTRACT:
A test probe for electronic circuit testing includes a probe arm joined to a printed circuit board adjacent to an electronic circuit to be tested, said probe arm having a flexible neck portion at one end. An electrically conductive tip is attached to the neck portion and has one end adapted to contact a portion of an electronic circuit. The neck portion of the probe arm is provided with a plurality of transverse slots and intermediate slots communicating between the transverse slots, the probe being provided with a flexible insert for extension across a preselected one of transverse slots in order to vary the probe tip pressure of the neck portion in directions substantially normal to the circuit under test.

REFERENCES:
patent: 2678685 (1954-05-01), Volsk
patent: 3891924 (1975-06-01), Ardezzone et al.
patent: 4045737 (1977-08-01), Coberly

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