Measuring and testing – Vibration – By mechanical waves
Patent
1979-01-02
1980-09-23
Kreitman, Stephen A.
Measuring and testing
Vibration
By mechanical waves
333165, G01N 2900, H03H 1900
Patent
active
042235600
ABSTRACT:
A variable delay system in which multistage delay lines are "shared" between different elements (e.g. different transducer elements or segments). A plurality of delay lines are provided, the delay lines having respectively different numbers of stages. The signals from the first and last segments of a segmented transducer are applied to opposing ends of the delay line having the largest number of stages. The signals from the second and next-to-last segments of the transducer are applied to opposing ends of the delay line having the next-to-largest number of stages, and so on. A plurality of coupling circuits are respectively associated with the plurality of delay lines and are operative to sample, as a function of time, the signals at different delay stages of their respective delay lines. The outputs of the coupling circuits are combined to form an image-representative signal.
REFERENCES:
patent: 2406340 (1946-08-01), Batchelder
patent: 4005382 (1977-01-01), Beaver
patent: 4012952 (1977-03-01), Dory
patent: 4019169 (1977-04-01), Takamizawa
patent: 4116229 (1978-09-01), Pering
patent: 4127034 (1978-11-01), Lederman et al.
Kreitman Stephen A.
New York Institute of Technology
Novack Martin
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