Variable delay gate circuit

Details Variable delay gate circuit Variable delay gate circuit

1984-12-10

1987-02-24

Heyman, John S.

Electrical transmission or interconnection systems

Nonlinear reactor systems

Parametrons

307254, 307592, H03K 513, H03K 5159

Patent

active

046459588

ABSTRACT:
A gate circuit device of an integrated circuit tester, for variably setting the signal propagation delay time of various integrated circuits to be tested at a predetermined value, includes a gate circuit having a pair of emitter coupled transistors and a constant current source transistor connected to the emitter side of the pair of transistors, and a terminal to apply a predetermined level of voltage to the base of the constant current source transistor to control the constant current. In addition to this manner of the voltage control of signal propagation delay time, a current adjustment circuit is utilized to generate current in a constant current source transistor in response to the control current. Thus, the gate circuit device controls the signal propagation delay time by regulating either voltage or current in response to the control current.

REFERENCES:
patent: 4180750 (1979-12-01), Ozawa et al.
patent: 4516041 (1985-05-01), Quan

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