Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Synchronizing
Reexamination Certificate
2001-09-05
2003-04-15
Cunningham, Terry D. (Department: 2816)
Miscellaneous active electrical nonlinear devices, circuits, and
Signal converting, shaping, or generating
Synchronizing
C327S161000
Reexamination Certificate
active
06549047
ABSTRACT:
BACKGROUND OF THE INVENTION
1. Field of the Invention
The present invention relates to a variable delay circuit which controls a delay circuit provided on a transfer path to vary the delay time of the delay circuit and to a semiconductor integrated circuit device having such a delay circuit.
The circuit design mainstream utilizes clock synchronization due to the recent progress towards increasing of the operation speed and the integration density. Hence, it becomes important to suitably supply a given circuit with a clock that is synchronized with an external clock signal. The latest art uses a DLL (Delay Locked Loop) circuit having the minimum delay time unit equal to approximately 200 ps in order to generate an internal clock which is synchronism with the external clock. As the frequency of the internal clock is increased, it is required that a variable delay circuit using the DLL circuit has a higher precision.
2. The Description of the Related Art
A description will now be given, with reference to
FIG. 1
, of a conventional variable delay circuit.
The circuit shown in
FIG. 1
has a four-stage delay circuit consisting of first, second, third and fourth delay circuits
201
,
202
,
203
and
204
, respectively.
The first delay circuit
201
includes gates G
201
and G
202
, and the second delay circuit
202
includes gates G
203
, G
204
and G
205
. The third delay circuit
203
includes gates G
206
, G
207
and G
208
, and the fourth delay circuit
204
includes gates G
209
, G
210
and G
211
. The first through fourth delay circuits
201
through
204
are supplied with switch input signals via switch terminals (SW) P
203
through P
206
. One of the switch input signals is switched to a high level (H), an input clock signal applied to an input terminal P
201
is delayed by a delay time based on which one of the switch input signals is switched to the high level. A resultant delayed clock signal is output via an output terminal P
202
. Each of the gates G
201
-G
211
has a unit delay time 1 td.
In the operation of the first delay circuit
201
, the gate G
201
is masked when the signal applied to the switch terminal P
203
is at a low level (L). The output signal obtained at the output terminal
202
is always at the low level irrespective of whether the other input of the gate G
201
is high or low. The gate
201
is released from the masked state when the signal applied to the switch terminal P
203
is at the high level. If the potential of the other input of the gate G
201
successively changes to the high level and the low level in this order, the output signal of the output terminal P
202
is changed to the high level and the low level in this order. Hence, when the signal applied to the switch terminal P
203
is at the high level, the delay time from the input terminal P
201
to the output terminal P
202
is equal to 2 td because the input signal passes through the two stages of gates therebetween.
In the operation of the second delay circuit
202
, the gate G
203
is masked when the signal applied to the switch terminal P
204
is at the low level. The output signal of the output terminal P
202
is always at the low level irrespective of whether the other input of the gate G
203
is high or low. The gate
203
is released from the masked state when the signal applied to the switch terminal P
204
is at the high level. If the potential of the other input of the gate G
203
successively changes to the high level and the low level in this order, the output signal of the output terminal P
202
is changed to the high level and the low level in this order. Hence, when the signal applied to the switch terminal P
204
is at the high level, the delay time from the input terminal P
201
to the output terminal P
202
is equal to 4 td because the input signal passes through the four stages of gates therebetween.
Similarly, the output signal of the output terminal P
202
obtained when the third delay circuit
203
or the fourth delay circuit
204
is activated by the switch signal applied to the switch terminal P
205
or P
206
, respectively. If the switch signal applied to the switch terminal P
205
is at the high level, the delay time provided from the input terminal P
201
to the output terminal P
202
is equal to 6 td, which corresponds to 6 gates. When the switch signal applied to the switch terminal P
206
is at the high level, the delay time from the input terminal P
201
to the output terminal P
202
is equal to 8 td, which corresponds to 8 gates.
Hence, the conventional variable delay circuit having four stages of delay circuits is capable of providing the variable times equal to 2 td to 8 td.
A description will now be given, with reference to
FIG. 2
, of a conventional DLL circuit utilizing the above-mentioned conventional variable delay circuit.
Referring to
FIG. 2
, a conventional DLL circuit
210
includes a variable delay circuit
212
, a phase comparator circuit
215
, and a delay control circuit
216
. The variable delay circuit
212
delays an external clock signal received by an input circuit
211
by a given delay time, and outputs the delayed external clock signal to an output circuit
213
. The phase comparator circuit
215
compares the phase of a reference signal “ref” supplied from the input circuit
211
with the phase of a signal “in” output by a dummy circuit
214
. The signal output by the dummy circuit
214
has a delay time equal to the sum of the delay times of the input circuit
211
, the variable delay circuit
212
and the output circuit
213
and the delay times of wiring lines provided between the input circuit
211
and the output circuit
213
. The conventional DLL circuit
210
thus configured functions to delay the clock signal from the input circuit
211
with a precision of approximately 200 ps so that the output clock signal having a predetermined phase relationship with the clock signal from the input circuit
211
.
A description will now be given, with reference to
FIG. 3
, of a phase setting process of the DLL circuit
210
. In
FIG. 3
, a symbol “ref” denotes the reference signal output by the input circuit
211
, and a symbol “in” denotes the signal output by the dummy circuit
214
. The DLL circuit
210
delays the external clock received via the input circuit
211
by a given delay time through the variable delay circuit
212
. The output circuit
213
receives the delayed clock signal from the variable delay circuit
212
and supplies a circuit of the following stage with the clock signal which has been pulled in phase with the external clock signal.
The dummy circuit
214
supplies the phase comparator circuit
215
with the signal “in” having the same delay time as that equal to the sum of the delay times of the input circuit
211
, the variable delay circuit
212
and the output circuit
213
and the delay times of the wiring lines provided therebetween (step S
101
). The input circuit
211
outputs, as the reference signal “ref”, the external clock signal to the phase comparator circuit
215
(step S
101
). The phase comparator circuit
215
determines whether the signals “ref” and “in” are in phase (step S
102
). If the signals “ref” and “in” are out of phase, the relative phase relationship therebetween is determined (step S
102
).
If the signals “ref” and “in” are in phase (“just” at step S
102
), the delay control circuit
216
holds the current delay time of the variable delay circuit
212
, and the phase comparator circuit
215
periodically performs the phase comparing operation.
If it is discerned, at step S
102
, that the signal “ref” from the input circuit
211
lags behind the signal “in” (“−1” at step S
102
), the phase comparator circuit
215
detects the phase difference therebetween. The delay control circuit
216
controls, based on the detected phase difference, the variable delay circuit
212
to reduce the delay time one stage by one stage (step S
103
). Then, the process returns to step S
101
so that the steps S
101
and S
102
via step S
103
are repeatedly carried out at predetermined interv
Tomita Hiroyoshi
Yamazaki Masafumi
Armstrong Westerman & Hattori, LLP
Tra Quan
LandOfFree
Variable delay circuit and semiconductor integrated circuit... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Variable delay circuit and semiconductor integrated circuit..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Variable delay circuit and semiconductor integrated circuit... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3071052