Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2006-12-15
2010-11-16
Assouad, Patrick J (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S457000, C324S660000, C324S661000, C324S672000, C324S679000, C324S680000, C324S686000, C324S690000
Reexamination Certificate
active
07834645
ABSTRACT:
A variable capacitance circuit includes a capacitance changing structure constructed by connecting a first construction unit, a second construction unit, a third construction unit, and a fourth construction unit, which each include a first electric element that hinders transmission of a direct current (DC) signal and has a capacitance that changes in accordance with the magnitude of an absolute value of an applied voltage, in the mentioned order in a ring. A voltage measuring apparatus measures the voltage of a measured object and includes a detection electrode capable of being disposed facing the measured object and the variable capacitance circuit described above. A power measuring apparatus includes a current measuring apparatus that measures current flowing in a measured object and the voltage measuring apparatus that measures the voltage of the measured object.
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English Language Abstract of JP 4-305171, 1992.
English Language Abstract of JP 6-242166, 1994.
English Language Abstract of JP 6-308179, 1994.
English Language Abstract of JP 7-244103, 1995.
English Language Abstract of JP 8-181038, 1996.
English Language Abstract of JP 8-271562, 1996.
English Language Abstract of JP 9-153436, 1997.
U.S. Appl. No. 11/539,891 to Yanagisawa, filed Oct. 10, 2006.
Assouad Patrick J
Greenblum & Bernstein P.L.C.
Hernandez Manuel
Hioki Denki Kabushiki Kaisha
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