Optics: measuring and testing – Photometers – Integrating spheres
Patent
1995-07-31
1998-04-28
Font, Frank G.
Optics: measuring and testing
Photometers
Integrating spheres
G01J 104
Patent
active
057452342
ABSTRACT:
A reflectometer and a method for measuring the reflectance and transmittance of material using an integrating sphere and a light concentrator. The reflectance and transmittance measurements are performed as a function of the angle of incidence of a beam of light onto a sample and reference material. In a preferred embodiment, a CHC-lens concentrator having a high f/# and a low index of refraction is used.
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R.A. Shepherd, Absolute Measurement of Diffuse and Specular Reflectance Ug an FTIR Spectrometer With an Integrating Sphere, Proc. of SPIE, vol. 1311, 55-69 (1990), no month available.
K. Snail et al., Integrating Sphere Designs With Isotropic Throughput, Applied Optics, vol. 28, No. 10, 1793-1799, May 15, 1989.
W. Richter et al., Accurate Diffuse Reflection Measurements in the Infrared Spectral Range, Applied Optics, Vo.. 26, No. 21, 4620-4624, Nov. 1, 1987.
X. Ning et al., Dielectric Totally Internally Reflecting Concentrators, Applied Optics, vol. 26, No. 2, 300-305, Jan. 15, 1987.
K. Gindele et al., Spectral Reflectance Measurements Using an Integrating Sphere in the Infrared, Applied Optics, vol. 24, No. 12, 1757-1760, Jun. 15, 1985.
Chenault David
Hanssen Leonard
Snail Keith A.
Font Frank G.
McDonnell Thomas E.
Merlina Amanda
The United States of America as represented by the Secretary of
Webb Ralph T.
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