Vacuum-sealed field-emission electron source and method of manuf

Active solid-state devices (e.g. – transistors – solid-state diode – Thin active physical layer which is – Low workfunction layer for electron emission

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

445 24, 438 20, 3151691, 313309, 313336, H01L 2906

Patent

active

059090332

ABSTRACT:
A recess portion in a bowl-like shape is formed at the center of a silicon substrate, and plural cathodes are formed in a matrix with a predetermined distance therebetween on the bottom of the recess portion. Around each cathode on the silicon substrate, a withdrawn electrode is formed with an insulating film disposed therebelow. A first wire layer connected with the withdrawn electrode at one end extends along a slant side face of the recess portion and on the top face of a protrusion portion. A sealing cover in the shape of a flat plate of a transparent glass plate or the like is integrated with the silicon substrate with a circular sealing material disposed therebetween. A space formed among the silicon substrate, the circular sealing material and the sealing cover is retained to be vacuated.

REFERENCES:
patent: 5199917 (1993-04-01), MacDonald et al.
patent: 5349217 (1994-09-01), Boysel
patent: 5367181 (1994-11-01), Yoshida
patent: 5532177 (1996-07-01), Cathey
patent: 5695378 (1997-12-01), Hecker, Jr. et al.
patent: 5760470 (1998-06-01), Stansbury

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Vacuum-sealed field-emission electron source and method of manuf does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Vacuum-sealed field-emission electron source and method of manuf, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Vacuum-sealed field-emission electron source and method of manuf will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-956447

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.