Chemistry: electrical and wave energy – Apparatus – Coating – forming or etching by sputtering
Patent
1997-02-25
1999-09-14
Nguyen, Nam
Chemistry: electrical and wave energy
Apparatus
Coating, forming or etching by sputtering
20419213, 20429807, 118663, 118712, C23C 1454
Patent
active
059518340
ABSTRACT:
A vacuum processing apparatus includes a process chamber capable of being evacuated and a gas quantity detector for outputting a gas quantity signal corresponding to a partial pressure of each kind of gas contained in the process chamber. The gas quantity detector has a detection sensitivity set in response to a sensitivity calibration signal externally supplied and generates the gas quantity signal at the set detection sensitivity. A controller receives the gas quantity signal output from the gas quantity detector and outputs the sensitivity calibration signal to the gas quantity detector so that a magnitude of the gas quantity signal for one reference gas selected from gasses contained in the process gas becomes near a target value. Vacuum processing techniques are provided for stably detecting the content of impurity gas by calibrating the sensitivity of the gas quantity detector.
REFERENCES:
patent: 4172020 (1979-10-01), Tisone et al.
patent: 4362936 (1982-12-01), Hofmann et al.
Fujitsu Limited
McDonald Rodney G.
Nguyen Nam
LandOfFree
Vacuum processing apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Vacuum processing apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Vacuum processing apparatus will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1507129