Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent
1995-11-15
1997-08-05
Nguyen, Vinh P.
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
324758, G01R 3102
Patent
active
056546319
ABSTRACT:
A semiconductor device test head docking interface system includes a test head plate juxtaposed to a test head. The tester plate includes pairs of outwardly facing spaced vacuum cups and pairs of spaced guiding and locking pins between the cups. A handler plate includes pairs of vacuum cup receiving surfaces spaced to receive the vacuum cups upon a docking of the plates, and pairs of receiving sockets spaced to receive the guiding and locking pins upon a docking of the plates. Rotary actuators are mounted on the tester plate for rotating each of the guiding and locking pins in a respective one of the receiving sockets, such that engagement and a pulling vacuum in the vacuum cups against the vacuum cup receiving surfaces and rotation of the guiding and locking pins, effects docking of the tester plate and handler plate. A Z-axis adjustment is provided in each actuator.
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inTEST, "The inTEST Handbook, A Guide to Test Head Positioning and Interfacing," Revision 4.0, available from inTEST Corporation, Western U.S. Office, Suite A, 1030 E. Duane Ave., Sunnyvale, CA 94086, Copyright 1992. (No Month Available).
MacDonald, Esq. Thomas S.
Nguyen Vinh P.
Xilinx , Inc.
Young Edel M.
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