Vacuum inlet

Radiant energy – Ionic separation or analysis – With sample supply means

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Details

250289, 250282, 250281, H01J 4936

Patent

active

055436196

ABSTRACT:
A sample inlet apparatus comprises a sample source (1) and a first enclosure (3), connected to the sample source via a first inlet (2). An analyser enclosure (7) is connected to the first enclosure (3) via a second inlet (5,15) substantially in alignment with the first inlet (2). Also provided is a second enclosure (10), connected to the analyser enclosure (7) via a third inlet (9) substantially in alignment with the first (2) and second (5,15) inlet, and vacuum pumps (4,11) for maintaining the first (3) and second enclosures (10) at a pressure lower than the sample source (1) and higher than that of the analyser enclosure (7) in use, whereby a molecular beam of sample molecules is generated along the axis of the inlet.

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Olivares & Houk, Ion Sampling for Inductively Coupled Plasma Mass Spectrometry, 1985, Anal. Chem., 57, 2674-2679.
Chambers et al., Fundamental Studies of the Sampling Process . . . Spectrometer, Spectrochimica Acta, vo. 46, No. 6/7, pp. 741-746, 1991.
McGraw-Hil, Encyclopedia of Science & Technology, 1977, Q121.M3, pp. 206-207.
McGraw-Hill, Handbook of Physics, 1958, Chapter 6, Vacuum Technique, pp. 5--78-5-81.

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