Vacuum chamber AC/DC probe

Details Vacuum chamber AC/DC probe Vacuum chamber AC/DC probe

2007-08-17

2010-02-09

Nguyen, Ha Tran T (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07659742

ABSTRACT:
Features of non-vacuum AC/DC probe systems are combined with features of the DC vacuum chamber testers to provide an AC/DC probe system that can be used in a vacuum environment, such as a SEM vacuum chamber. Features of the DC vacuum chamber tester are modified to include new op-amp circuitry that provides the AC/DC testing functionality of the non-vacuum chamber systems, resulting in an AC/DC probe system that can be used in a vacuum environment.

REFERENCES:
patent: 5321363 (1994-06-01), Wakamatsu et al.
patent: 5742172 (1998-04-01), Yasutake
patent: 6211686 (2001-04-01), Matsuzawa et al.
patent: 6888135 (2005-05-01), Naitou et al.

Affiliated with

Also associated with

Rating

Vacuum chamber AC/DC probe does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Vacuum chamber AC/DC probe, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Vacuum chamber AC/DC probe will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4171466