Using time domain reflectometry to detect mismatched...

Details Using time domain reflectometry to detect mismatched... Using time domain reflectometry to detect mismatched...

2006-11-28

2006-11-28

Benson, Walter (Department: 2858)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Distributive type parameters

C324S538000

Reexamination Certificate

active

07141986

ABSTRACT:
A system for detecting connector compatibility with a time domain reflectometry (TDR) circuit on a peripheral device. A cable connects the peripheral device and a second peripheral device. A first connector is for mating to a second connector on the second peripheral device. The time domain reflectometry can be used to detect electrical compatibility of the first and second connectors. The first connector can be an RJ11 connector. The second connector can be an RJ45 connector. The first connector can be a plug, and the second connector can be a socket. The number of pins of the first and second connectors can be different. The first connector can be a telco connector, and the second connector can be an Ethernet connector. The TDR circuit can be part of the peripheral device diagnostics.

REFERENCES:
patent: 6417672 (2002-07-01), Chong
patent: 6420878 (2002-07-01), Boorom
patent: 6629269 (2003-09-01), Kahkoska
patent: 7005861 (2006-02-01), Lo et al.
patent: 2004/0251912 (2004-12-01), Pharn et al.

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