Using power-on mode to control test mode

Details Using power-on mode to control test mode Using power-on mode to control test mode

1998-06-18

2000-06-13

Lam, Tuan T.

Miscellaneous active electrical nonlinear devices, circuits, and

Signal converting, shaping, or generating

Particular stable state circuit

714734, G01R 3128

Patent

active

06075396&

ABSTRACT:
The improved pin system enables a single, shared pin of a semiconductor device to have multiple functions that include: receiving data that determines the operating mode of the semiconductor device and also receiving data unrelated to the operating mode of the semiconductor device. The improved pin system comprises the single, shared pin coupled to a data latch. The data latch is configured to store operating mode data from the single, shared pin. This operating mode data preferably corresponds to a particular operating mode such as a functional mode or a test mode. Preferably, in response to the operating mode data stored in the data latch, the semiconductor device operates in either the functional mode or the test mode. As long as the data latch stores the operating mode data, this shared, single pin is capable of receiving data unrelated to the operating mode of the semiconductor device without changing the current operating mode of the semiconductor device.

REFERENCES:
patent: 5144627 (1992-09-01), Horie et al.
patent: 5416784 (1995-05-01), Johnson
patent: 5479127 (1995-12-01), Bui
patent: 5889787 (1999-03-01), Cauchy

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