Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-12-26
2006-12-26
Raymond, Edward (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C438S017000
Reexamination Certificate
active
07155352
ABSTRACT:
In some embodiments, a chip includes transmitters to provide transmit signals to chip interfaces and voltage control circuitry to control voltages of the transmit signals. The chip further includes receivers to receive external signals from another chip. The chip also includes evaluation circuitry to determine whether the transmit signals were usable by the other chip based on an evaluation of at least one of the received external signals and to provide a usability indicating signal to the voltage control circuitry indicative of whether the transmit signals were usable by the other chip. Other embodiments are described and claimed.
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Intel Corporation
Pedigo Philip A.
Raymond Edward
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