Active solid-state devices (e.g. – transistors – solid-state diode – Gate arrays – With particular signal path connections
Reexamination Certificate
2008-02-29
2009-06-23
Menz, Douglas M (Department: 2891)
Active solid-state devices (e.g., transistors, solid-state diode
Gate arrays
With particular signal path connections
C257S529000, C438S130000
Reexamination Certificate
active
07550789
ABSTRACT:
Techniques and systems whereby operation of and/or access to particular features of an electronic device may be controlled after the device has left the control of the manufacturer are provided. The operation and/or access may be provided based on values stored in non-volatile storage elements, such as electrically programmable fused (eFUSES).
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Iyer, S. & Kothandaraman, C., “Electrically Programmable Fuse (eFUSE) Using Electromigration in Silicides,” IEEE Electron Device Letters, vol. 23, No. 9. Sep. 2002.
Office Action for U.S. Appl. No. 11/016,219, Dated Feb. 5, 2008.
Bonaccio Anthony R.
Erickson Karl R.
Fifield John A.
Kothandaraman Chandrasekharan
Paone Phil C.
International Business Machines - Corporation
Menz Douglas M
Patterson & Sheridan LLP
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