Using electrically programmable fuses to hide architecture,...

Active solid-state devices (e.g. – transistors – solid-state diode – Gate arrays – With particular signal path connections

Reexamination Certificate

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C257S529000, C438S130000

Reexamination Certificate

active

07550789

ABSTRACT:
Techniques and systems whereby operation of and/or access to particular features of an electronic device may be controlled after the device has left the control of the manufacturer are provided. The operation and/or access may be provided based on values stored in non-volatile storage elements, such as electrically programmable fused (eFUSES).

REFERENCES:
patent: 6753590 (2004-06-01), Fifield et al.
patent: 7268577 (2007-09-01), Erickson et al.
patent: 7274283 (2007-09-01), Yosim et al.
patent: 2001/0050578 (2001-12-01), Yamamoto
patent: 2006/0119384 (2006-06-01), Camarota et al.
patent: 2006/0136751 (2006-06-01), Bonaccio et al.
patent: 2006/0136858 (2006-06-01), Erickson et al.
Iyer, S. & Kothandaraman, C., “Electrically Programmable Fuse (eFUSE) Using Electromigration in Silicides,” IEEE Electron Device Letters, vol. 23, No. 9. Sep. 2002.
Office Action for U.S. Appl. No. 11/016,219, Dated Feb. 5, 2008.

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