Using electrically programmable fuses to hide architecture,...

Semiconductor device manufacturing: process – Making device array and selectively interconnecting – Rendering selected devices operable or inoperable

Reexamination Certificate

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C438S132000, C257S209000, C326S008000

Reexamination Certificate

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07442583

ABSTRACT:
Techniques and systems whereby operation of and/or access to particular features of an electronic device may be controlled after the device has left the control of the manufacturer are provided. The operation and/or access may be provided based on values stored in non-volatile storage elements, such as electrically programmable fused (eFUSES).

REFERENCES:
patent: 6753590 (2004-06-01), Fifield et al.
patent: 7274283 (2007-09-01), Yosim et al.
IEEE Electron Device Letters, vol. 23, No. 9, Sep. 2002, “Electrically Programmable Fuse (eFUSE) Using Electromigration in Silicides”, by C. Kothandaraman and S. Iyer.

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