X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1995-12-07
1998-09-08
Wong, Don
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 86, 378 57, 378154, G01N 23201
Patent
active
058056629
ABSTRACT:
A method of nondestructive investigation of the internal structure of an object uses deflected penetrating radiation. In one embodiment, an incident penetrating radiation flow 4 with angular divergence restricted by a collimator 3 passes through an object 5 to create the a radiation flow 6 registered by a direction-selective detector 10. Typically, the directivity pattern of detector 10 selects a desired angle and has a width no larger than twice the local angular divergence of the incident penetrating radiation flow 4. The desired angle can be the maxima of a scattering pattern for a substance suspected of being in object 5. To improve the quality and range of measurements, the local restrictions of radiation flow 4 is fulfilled in the two intersecting planes; and detector 10 and/or incident radiation flow 4 can be swept through a range of orientations to detect radiation deflected at a range of angles larger than the directivity pattern detector 10 has when fixed.
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L. M. Soroko, "Gilbert's Optics," Nauker, 1981, pp. 34-37, 90-93, 126-127, 160-169, and 236-239.
Vinogradov et al., "Investigation of a Steering Mirror for the Soft X-Ray Region," Nuclear Instruments and Methods in Physics Research, 1987, pp. 11-12.
Vinogradov et al., "Turning a Ray of Soft X-Ray Radiation by Means of a Spherical Surface," (Russian publication, 13 Nov. 1985) pp. 594-596.
Mitrofanov, et al, Method of Obtaining the Shadow of an Object Internal Structure with the aid of Penetrating Radiation, NAOUKA Pub., 1982, pp. 221-222.
Kurbatov Alexey V.
Lazarev Pavel I.
Millers David T.
Quanta Vision, Inc.
Wong Don
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