Using crack arrestor for inhibiting damage from dicing and...

Semiconductor device manufacturing: process – Semiconductor substrate dicing – Having a perfecting coating

Reexamination Certificate

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Details

C438S033000, C438S068000, C438S113000, C438S114000, C438S458000, C438S460000, C438S462000

Reexamination Certificate

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07955955

ABSTRACT:
A semiconductor product comprises a semiconductor substrate having a top surface and a bottom surface including a semiconductor chip. The semiconductor substrate has a top surface and a perimeter. A barrier is formed in the chip within the perimeter. An Ultra Deep Isolation Trench (UDIT) is cut in the top surface of the chip extending down therein between the perimeter and the barrier. A ILD structure with low-k pSICOH dielectric and hard mask layers is formed over the substrate prior to forming the barrier and the UDIT. The ILD structure interconnection structures can be recessed down to the substrate aside from the UDIT.

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