Using a parametric measurement unit for converter testing

Details Using a parametric measurement unit for converter testing Using a parametric measurement unit for converter testing

2006-04-04

2006-04-04

Nguyen, Linh V. (Department: 2819)

Coded data generation or conversion

Converter calibration or testing

C341S118000

Reexamination Certificate

active

07023366

ABSTRACT:
In one aspect, the invention is an integrated circuit (IC) for use in testing an analog-to-digital (ADC) converter includes a first channel of a parametric measurement unit (PMU) configured to send a force signal to the ADC. The IC also includes a first digital-to-analog converter (DAC) connected to the first channel of the PMU. The DAC has a DC level of accuracy of less than 1 millivolt.In another aspect, the invention is an integrated circuit (IC) for use in testing a digital-to-analog-converter-device-under-test (DACDUT). The IC includes a first channel of a parametric measurement unit (PMU) configured to send a force signal to the DACDUT and including an output port for taking measurements, a first digital-to-analog converter (DAC) connected to the first channel of the PMU and a PMU measurement path connected to the output port having a DC level of accuracy of less than 1 mV.

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