Data processing: measuring – calibrating – or testing – Measurement system – Statistical measurement
Reexamination Certificate
2006-02-22
2008-03-25
Lau, Tung S. (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Statistical measurement
Reexamination Certificate
active
07349823
ABSTRACT:
Embodiments of the present invention provides a system that optimizes a regression model which predicts a signal as a function of a set of available signals. These embodiments use a genetic technique to optimize the regression model, which involves using a portion of the sample signals used to generate each parent regression model from a pair of best-fit parent regression models to generate a child regression model. In addition, in embodiments of the present invention, the system introduces “mutations” to the set of sample signals used to create the child regression model in an attempt to create more robust child regression models during the optimization process.
REFERENCES:
patent: 4937763 (1990-06-01), Mott
patent: 2003/0176931 (2003-09-01), Pednault et al.
Dhanekula Ramakrishna C.
Gross Kenny C.
Whisnant Keith A.
Lau Tung S.
Park Vaughan & Fleming LLP
Sun Microsystems Inc.
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