User-proposed entry field(s) for customized data...

Optics: eye examining – vision testing and correcting – Eye examining or testing instrument – Objective type

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C351S211000

Reexamination Certificate

active

08002410

ABSTRACT:
One embodiment of the present invention is a method to not limit the device's manipulation of the data to that of the manufacturer, but to allow greater freedom for customization by the individual user for their preference.

REFERENCES:
patent: 4141652 (1979-02-01), Feinleib
patent: 5164578 (1992-11-01), Witthoft et al.
patent: 5568208 (1996-10-01), Van de Velde
patent: 5777719 (1998-07-01), Williams
patent: 6199986 (2001-03-01), Williams et al.
patent: 6376819 (2002-04-01), Neal
patent: 6685317 (2004-02-01), Su
patent: 6709108 (2004-03-01), Levine et al.
patent: 6791696 (2004-09-01), Fantone
patent: 6827444 (2004-12-01), Williams et al.
patent: 6964480 (2005-11-01), Levine
patent: 7665846 (2010-02-01), Campin et al.
patent: 7771048 (2010-08-01), Dai et al.
patent: 2002/0169441 (2002-11-01), Lemberg
patent: 2003/0053031 (2003-03-01), Wirth
patent: 2004/0004696 (2004-01-01), Davis et al.
patent: 2004/0156015 (2004-08-01), Campbell
patent: 2005/0134851 (2005-06-01), Murphy
Dave, T., “Wavefront aberrometry Part 1: Current Theories and Concepts”, Optometry Today, Nov. 19, 2004, pp. 41-45.
Ginis, H.S. et al., Variability of wavefront aberration measurements in small pupil sizes using a clinical Shack-Hartmann aberrometer, BMC Ophthalmology, Feb. 11, 2004, 4:1 copyright 2004 Ginis et al.
Liang, J. et al., Objective measurements of wave aberrations of the human eye with the use of a Hart-Shackman wave-front sensor, J. Opt. Soc. Am. A., vol. 11, No. 7, Jul. 1994, pp. 1949-1957, copyright 1994 Optical Society of America.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

User-proposed entry field(s) for customized data... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with User-proposed entry field(s) for customized data..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and User-proposed entry field(s) for customized data... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2632363

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.