Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – Analysis of complex waves
Reexamination Certificate
2006-02-07
2006-02-07
Nguyen, Vincent Q. (Department: 2858)
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
Analysis of complex waves
C324S076280, C324S076580, C702S073000
Reexamination Certificate
active
06995553
ABSTRACT:
Measurements for an eye diagram of a signal of interest are placed in a data structure that is examined to locate an eye opening of interest. The eye opening of interest has already been, or is subsequently, normalized into figure of merit units related to the operational voltage and timing requirements of the data receiver for that signal. The locations within the normalized eye opening may be taken as center locations for trial symmetric shapes that start out small and are enlarged until they first include locations not part of the normalized eye opening. The center of a largest such shape is mapped back into the units of the original eye diagram as optimum sampling parameters for data analysis equipment that uses the receiver to sample the signal once per unit interval to discover logical value. An alternative is to repeatedly remove the ‘outer layer’ of the normalized eye opening until only one location remains.
REFERENCES:
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patent: 5162723 (1992-11-01), Marzalek et al.
patent: 5978742 (1999-11-01), Pickerd
patent: 6799127 (2004-09-01), Sontag et al.
patent: 2003/0142770 (2003-07-01), Engl et al.
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