Use of sub (partial) cycles, nested cluster cycles, and lot...

Details Use of sub (partial) cycles, nested cluster cycles, and lot... Use of sub (partial) cycles, nested cluster cycles, and lot...

2004-04-09

2008-03-11

Picard, Leo (Department: 2125)

Data processing: generic control systems or specific application

Specific application, apparatus or process

Product assembly or manufacturing

C700S100000, C703S006000

Reexamination Certificate

active

07343211

ABSTRACT:
A system and method for the simulation and modeling of biopharmaceutical batch process manufacturing facilities using process time lines is described herein. The system employs an eleven-field delimited string code which specifies the unit identifier code and the iteration value for each of the ten levels of nested scheduling cycles of the biopharmaceutical drug production process being modeled. The method includes generating a process time line using operational parameters, a block flow diagram, and a set of scheduling cycles for each of a sequence of unit operations. The process time line is used as a tool for batch processing and facility design.

REFERENCES:
patent: 6311093 (2001-10-01), Brown
patent: 6311095 (2001-10-01), Brown
patent: 6662061 (2003-12-01), Brown
patent: 2001/0018643 (2001-08-01), Brown
patent: 2001/0027385 (2001-10-01), Brown
patent: 2001/0044710 (2001-11-01), Brown
patent: 2002/0035457 (2002-03-01), Brown
patent: 2003/0033045 (2003-02-01), Brown
patent: 2004/0098159 (2004-05-01), Brown
patent: WO 98/59285 (1998-12-01), None
patent: WO 01/13319 (2001-02-01), None

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