X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2006-02-22
2008-08-05
Arana, Louis M (Department: 2831)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
C378S086000
Reexamination Certificate
active
07409042
ABSTRACT:
Methods and systems for detecting potential items of interest in target samples, using nuclear resonance fluorescence, utilize incident photon spectra that are narrower than traditional bremsstrahlung spectra but overlap nuclear resonances in elements of interest for purposes of detection, such as but not limited to the detection of threats in luggage or containers being scanned.
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Bertozzi William
Ledoux Robert J.
Arana Louis M
Foley & Hoag LLP
Passport Systems, Inc.
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