Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2008-07-15
2008-07-15
Barlow, Jr., John E (Department: 2863)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
Reexamination Certificate
active
07400996
ABSTRACT:
The present invention provides a voltage margin testing system incorporated in an electronic system, such as, a computer system (e.g., a server), having a plurality of components for at least some of which voltage margin testing is required. A voltage margin testing of the invention can include a controller, such as a Baseboard Management Controller (BMC), internal to the computer system and a digital voltage adjuster, e.g., a digital potentiometer, that is in communication with the controller. The voltage adjuster can effect generation of one or more test voltages, for example, by varying resistance in a feedback circuitry of a regulator whose output voltage is applied to system components, for application to the components in response to commands from the controller.
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Monfared Akbar
Percer Benjamin Thomas
Robertson Naysen Jesse
Barlow Jr. John E
Bhat Aditya
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