Use of arrays of atomic force microscope/scanning tunneling...

Measuring and testing – Surface and cutting edge testing – Roughness

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Reexamination Certificate

active

10748526

ABSTRACT:
A surface analysis device is disclosed for identifying molecules by simultaneously scanning nanocodes on a surface of a substrate. The device includes a scanning array that is capable of simultaneously scanning the nanocodes on the surface of the substrate and an analyzer that is coupled with the scanning array. The analyzer is capable of receiving simultaneously scanned information from the scanning array and identifying molecules associated with the nanocodes.

REFERENCES:
patent: 5047633 (1991-09-01), Finlan et al.
patent: 6514767 (2003-02-01), Natan
patent: 2002/0172963 (2002-11-01), Kelley et al.
patent: 2003/0033863 (2003-02-01), Ashby et al.
patent: 2004/0058328 (2004-03-01), Chan et al.
Doering, et al., “Spectroscopic Tags Using Dye-Embedded Nanoparticles and Surface -Enhanced Raman Scattering”,Analytical Chemistry, :5-9.
Mulvaney, et al., “Glass-Coated, Analyte-Tagged Nanoparticles: A New Tagging System Based onDetectionwith Surface-Enhanced Raman Scattering”,Am Chem Soc.19:4784-4790 (2003).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Use of arrays of atomic force microscope/scanning tunneling... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Use of arrays of atomic force microscope/scanning tunneling..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Use of arrays of atomic force microscope/scanning tunneling... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3861401

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.