Coded data generation or conversion – Converter calibration or testing – Trimming control circuits
Reexamination Certificate
2006-09-19
2006-09-19
Wamsley, Patrick (Department: 2819)
Coded data generation or conversion
Converter calibration or testing
Trimming control circuits
C711S103000, C711S154000
Reexamination Certificate
active
07109901
ABSTRACT:
In a semiconductor integrated circuit, serially inputted trimming data are sequentially written to plural memory cells in accordance with selection signals for trimming a bleeder resistor, making it possible to dispense with a data register for storing the trimming data, thereby saving layout area.
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Adams & Wilks
Seiko Instruments Inc.
Wamsley Patrick
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